The Model 4200-SCS-PK3 High Resolution and Power IV & CV Bundled Characterization Solution offers 210V/100mA, 0.1fA resolution, and 1kHz to 10MHz for power devices, high dielectric, deep sibmicron CMOS characterization. It consists of a Model 4200-SCS Parameter Analyzer, KTEI test software, two Model 4200-SMU modules, two Model 4210-SMUs, two Model 4200-PA preams, one Model 4210-CVU module, test fixture with sample devices, and cables.

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