The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests as well as provide precision measurement and high resolution with LCR meter support.

Optional Instrumentation:

Model 4225-PMU Ultra-Fast I-V Module
Model 4220-PGU Pulse Generator Unit (Voltage-Source only)
Model 4225-RPM Remote Amplifier/Switch
Model 4200-SMU Medium Power Source-Measure Unit
Model 4210-SMU High Power Source-Measure Unit for 4200-SCS
Model 4200-PA Remote PreAmp Option for 4200-SMU and 4210-SMU
Model 4210-CVU 1kHz - 10MHz Capacitance Voltage Measurement Unit
Model 4200-SCP2 Dual-Channel Oscilloscope Card
Model 4200-SCP2HR 200MS Dual-Channel Oscilloscope Card

Ultra-Fast I-V Application Package:
Model 4225-PMU Ultra-Fast I-V Module

Product Average Rating:

(0 reviews)

No current Alternatives.
You may find Alternatives in category.