The modular TLA7000 Logic Analyzer Series provides the speed and flexibility you need to capture logic detail on today’s fastest microprocessors and memory designs. Pinpoint the source of elusive errors and gain the visibility you want with large easy-to-read displays, fast data throughput, and time-correlated views of analog and digital signals through the same probe.

FeaturesBenefitsMagniVu__ acquisitionAvoid missing events completely in either timing or state acquisition mode with higher sampling resolution (up to 20 ps) on all channels.iCapture__ multiplexingEliminate double probing with simultaneous digital and analog acquisition through a single logic analyzer probe.Flagging the glitchRemove the need to manually search all channels using exclusive ability to show both the time and channel where the glitch occurred.TS/TH violation triggeringEliminate the time consuming and complex task of monitoring the circuit’s outputs with real-time violation triggering that automatically acquires intermittent setup and hold violations.iView__ displayGain complete system visibility with time-correlated, integrated analog and digital data on one display.iVerify__ analysisQuickly find signal integrity issues with multi-channel bus analysis using oscilloscope-generated eye diagram.Automated measurementsEasily summarize your design’s performance with sophisticated measurements such as: frequency, period, pulse width, duty cycle, and edge count.Drag & drop triggersQuickly isolate events through simple and intuitive trigger setup. Triggers include: Channel Edge, Channel Value, Bus Value, Multi-Group Value, Glitch, Setup and Hold Violation, or Trigger on Anything.

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