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Manufacturer: Hp/Agilent/Keysight
Model: 4072A
Description:
An all-in-one solution for advanced semiconductor process needs. The 4072A provides high throughput, production parametric test, ring oscillator measurement, Flash cell evaluation, advanced WLR tests.
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The Keysight 4072A advanced parametric tester with Keysight SPECS is designed to perform precision DC measurement, capacitance measurement, flash memory cell testing, and testing of other high-frequency applications. The system supports up to eight source monitor units (SMUs), two of which may be high-power SMUs (HPSMUs). Each SMU is self-calibrating and may be individually configured to force either current or voltage and simultaneously measure either voltage or current.
General features
Supports up to 2xHPSMU and up to 8 total SMUs
Low-leakage switching matrix, customizable from 12 to 48 fully-guarded Kelvin outputs
High-frequency switching matrix with integrated pulse generator control
8 auxiliary inputs and 48 extended path inputs for support of external instruments
Measurement capabilities
2 microvolt and 10 femtoamp measurement resolution (MPSMU and HPSMU)
+/- 200 Volts and +/- 1 Amp output capability (HPSMU)
1 kHz to 1 MHz capacitance frequency measurement range (using 4284A or E4980A)
+/- 1.6 Amp ground unit (GNDU)
HV-SPGU option measurement capabilities
+/-40 V output (80 V peak-to-peak) at high impedance
Pulse rise and fall times as fast as 20 ns
Three-level output pulse capability
Arbitrary Linear Waveform Generation (ALWG) function
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