The E4991B Impedance Analyzer has a frequency range of 1 MHz to 3 GHz. The E4991B provides 0.65% basic accuracy over a wide impedance range with a 40 V built-in DC bias source (Option 001). The equivalent circuit analysis function supports seven different multi-parameter models and helps you to simulate your own equivalent parameter values of components.

Three frequency options (1 MHz to 500 MHz/1 GHz/3 GHz) and frequency upgrades allow you to choose the most appropriate option with the latest amount of investment.

Material measurement options provide temperature characteristics analysis capability (Option 007) and direct read function of permittivity and permeability (Option 002).

Probe station connection kit (Option 010) offers an accurate on-wafer or micro-component impedance measurement solution up to 3 GHz.

The E4991B supports a wide variety of test accessoriesthat designed to make measurements simple and reliable.

Whether you are in R&D, QA or inspection, the E4991B is an ideal solution for characterizing and evaluating electronic components, semiconductor devices and materials.

Application Example:

Passive components: Impedance measurement of chip components such as capacitors, inductors, ferrite beads, resistors, or crystal/ceramic resonators.

Semiconductor components: C-V characteristics analysis and equivalent series resistance measurement of varactor diodes.

Dielectric material: Permittivity and loss tangent evaluation of plastics, ceramics, and printed circuit boards.

Magnetic material: Permeability and loss tangent evaluation of ferrite, amorphous and other magnetic materials.

Three frequency options: 1 MHz to 500 MHz/1 GHz/3 GHz, upgradable

0.65% basic accuracy and 120 m_ to 52 k_ impedance range (10% measurement accuracy range)

Measurement parameters: |Z|, |Y|, , R, X, G, B, L, C, D, Q, ||, x, y, , Vac, Iac, Vdc1, Idc1 (1. Option 001 is required)

Built-in DC bias (Option 001): 0 V to 40 V, 0 A to 100 mA

4-chnannel & 4-trace on 10.4 inch color LCD with touch screen

Data analysis function: Equivalent circuit analysis, limit line test

Dielectric/magnetic material measurement (Option 002):|r|, r’, r’’, tan(), |_r|, _r’, r’’, tan()

Temperature characteristics measurement (Option 007) and reliable onwafer measurement (Option 010) capabilities

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