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The Model 4200-SCS-PK2 High Resolution IV & CV Bundled Characterization Solution offers 210V/100mA, 0.1fA resolution, and 1kHz to 10MHz for high dielectric, deep sibmicron CMOS characterization. It consists of a Model 4200-SCS Parameter Analyzer, KTEI test software, two Model 4200-SMU modules, a Model 4200-PA preamp, one Model 4210-CVU module, test fixture with sample devices, and cables.
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