Hp/Agilent/Keysight N2802A 25 GHz InfiniiMax III Series probe amplifier

Product Details

  • Manufacturer: Hp/Agilent/Keysight

  • Model: N2802A

  • Description:

    The InfiniiMax III probing system offers you the highest performance available for measuring differential and single-ended signals, with flexible connectivity solutions for todays high-density ICs and circuit boards.

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The InfiniiMax III probing system provides the highest bandwidth and incredibly low loading to allow for a completely new level of signal fidelity and accuracy. Four different InfiniiMax III probe amplifiers ranging from 16 GHz to 30 GHz are available for matching your probing solution to your performance and budget requirements. A proprietary 200 GHz fT InP (indium phosphide) IC process with backside ground vias and novel thick film technology is utilized for the InfiniiMax III probe system to accommodate your highest performance needs and is unmatched by any product in the market.

Key Features

Full 25 GHz to the probe tip

Industry&rsquo slowest probe and scope system noise

Industry&rsquo s highest fidelity and accuracy due to bandwidth and extremely low loading

Probe amplifiers loaded with measured s-parameters for more accurate response correction

Probe bandwidth upgradable

Variety of probe heads for different use models with maximum usability

Bandwidth:

25 GHz

Tr = 17.4 psec

Range:

DC attenuation ratio : 6:1 (3:1 with 200 ZIF tip)

Input voltage range : 1.6 Vpp (0.8 Vpp with 200 ZIF tip)

Input common mode range : 12 V at DC to 250 Hz, 2.5 V at >250 Hz (6 V at DC to 250 Hz, 1.25 V at >250 Hz with 200 ZIF tip)

Offset range : 16 V when probing a single-ended signal

Input Impedance:

DC input resistance : R diff = 100 k 2%, R se = 50 k 2%

Input resistance @ >10 kHz : R diff = 1 k, R se = 500

Input capacitance : C diff = 32 fF, C se = 48 fF (with ZIF probe head)

Connectivity:

N5445A InfiniiMax III browser

N5439A InfiniiMax III ZIF probe head

N5444A InfiniiMax III 2.92 mm/3.5 mm/SMA probe head

N5441A InfiniiMax III solder-in probe head

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