In addition to 4155C, Keysight 4156C offers highly accurate laboratory bench top solution for advanced device characterization.

The 4280A was discontinued on November 1, 2000 and became obsolete on January 1, 2006.

Keysight B1500A Semiconductor Device Parameter Analyzer is complete device characterization solution supporting versatile measurement capabilities for IV, CV and leading-edge fast pulsed IV measurement with uncompromised measurement reliability.

High-performance switching matrix, located between the semiconductor parameter analyzer and the wafer, reduces cost of test through characterization test automation.

The Keysight 4082A is a high-throughput production parametric test system with advanced parallel testing capabilities, a high-speed capacitance measurement option, and full support for SEMI factory automation standards.

The 4142B was discontinued on July 1, 2003, and became obsolete on September 1, 2008.

In addition to the parametric test capabilities of the 4082A, the Keysight 4082F supports high-voltage semiconductor pulse generator units (HV-SPGUs) for Flash memory cell testing.

The E5270A, E5272A, and E5273A were discontinued on November 1, 2004, and are under support through December 31, 2012.

The 4157B offers flexibility, expandability, and upgradeability in a PC-based measurement environment, providing a complete solution for parametric measurement and analysis.

The Keysight 41501B SMU and Pulse Generator Expander unit is available to augment the measurement capabilities of the 4155C and 4156C. It is user-configurable and offers additional SMUs and PGUs.