ASUR SDR is a high-performance, low-cost, accelerated reliability and parametric solution for single-site testing using instruments-based solutions on the Windows platform.

ASUR RDA is a high-performance, low-cost, accelerated reliability and parametric test data analysis solution. ASUR RDA speeds lifetime extraction for faster test cycle time and time-to-decisions.

Core Wafer Systems extensive knowledge base of over 100 man-years of semiconductor industry experience in nearly every aspect of the parametric and reliability test…

The E5250A Low-leakage Switch Mainframe provides plug-in modules to integrate CV-IV measurements with an automated measurement system for long-term reliability tests.

High-performance switching matrix, located between the semiconductor parameter analyzer and the wafer, reduces cost of test through characterization test automation.

Provides up to 7680 data channels for thin film transistor (TFT) array testing of a-Si LCDs used in the manufacturing of sixth- and seventh-generation flat panel displays.

Provides up to 15,360 data channels and multi site test for thin film transistor (TFT) array testing of a-Si LCDs used in the manufacturing of seventh- and eighth-generation flat panel displays.

N9201A is an optional test system for both 4070 and 4080 series and provides you with greater throughput improvement.