Now, there are two new good reasons to choose Series 2600 System SourceMeter® Multi-Channel I-V Test Instruments for your next semiconductor parametric analysis and test system: the single-channel Model 2635 and two-channel Model 2636, designed especially for low current test applications. Like the rest of the Series 2600 family, they pack a lot of testing capability into one half-rack, 2U instrument: a precision power supply, a true current source, 5½-digit multimeter, a voltage or current pulse generator with measurement, a low frequency arbitrary waveform generator, an electronic load, and a trigger controller. Optimized for low current applications With 1fA measurement resolution, the Model 2635 and 2636 are optimized for applications that require low current sourcing and measurement capabilities, such as semiconductor device characterization, parametric analysis, reliability, and wafer sort; low current testing of optoelectronic devices, sensors, and discretes; research and education lab applications such as materials and dielectrics testing, Hall effect, and van der Pauw measurements; and low power characterization in nanotechnology research applications. Made for building high throughput test solutions that lower your cost of test These new low current solutions complement a variety of other Keithley solutions for building larger, more capable test systems. For example, they offer a convenient, economical way to add three more low current measurement ranges to Series 2600-based Automated Characterization Suite (ACS) test systems, which are designed for semiconductor characterization at the device, wafer, or cassette level, making possible significant throughput advantages by testing multiple devices in parallel. Series 2600 instruments are also designed to work in tandem with Keithley’s recently introduced Series 3700 System Switch/ Multimeter mainframes to create high throughput test systems for a variety of other devices and components.